The 8-inch N-type SiC double-side polished substrate is a silicon carbide wafer with a diameter of 8 inches (approximately 200 millimeters), processed through double-side polishing to achieve high flatness and smoothness, utilized in the manufacturing of high-power electronic devices such as power MOSFETs, Schottky diodes, and high-frequency RF devices due to its excellent material properties for efficient and reliable applications.
Specifications of 8 inch N-type SiC Double-side Polished Substrate
Items | Unit | Ultra-P | Production | Dummy | |||||
Boule Parameters | |||||||||
Polytype | -- | 4H | |||||||
Surface orientation error | 。 | 4°toward<11-20>±0.5° | |||||||
Electrical Parameters | |||||||||
Dopant | -- | n-type Nitrogen | |||||||
Resistivity | ohm.cm | 0.015~0.025ohm.cm NA | |||||||
Mechanical Parameters | |||||||||
Diameter | mm | 200.0±0.2mm | |||||||
Thickness | μm | 350/500±25μm | |||||||
Notch orientation | 。 | [1-100]±5 | |||||||
Notch Depth | mm | 1~1.5mm | |||||||
LTV | μm | ≤3μm(10mm*10mm) | ≤5μm(10mm*10mm) | ≤15μm(10mm*10mm) | |||||
TTV | μm | ≤7μm | ≤10μm | ≤20μm | |||||
Bow | μm | -20μm~20μm | -25 μm~25μm | -65μm~65μm | |||||
Warp | μm | ≤30μm | ≤35μm | ≤70μm | |||||
Front(Si-face)Roughness(AFM) | nm | Ra≤0.2nm | |||||||
Structure | |||||||||
Micropipe density | ea/cm² | <0.2ea/cm² | <2ea/cm² | ≤50ea/cm² | |||||
Metal impurities | atoms/cm | ≤1E11atoms/cm²(Al, Cr, Fe,Ni, Cu, Zn, Pb, Na, K, Ti, Ca,V, Mn) | |||||||
TSD | ea/cm² | ≤200ea/cm² | ≤500ea/cm² | NA | |||||
BPD | ea/cm² | ≤1000ea/cm² | ≤2000ea/cm² | NA | |||||
TED | ea/cm² | ≤3000ea/cm² | ≤7000ea/cm² | NA | |||||
Front Quality | |||||||||
Front | Si | ||||||||
Surface Finish | Si - CMP Si-face CMP | ||||||||
Particles | ea/wafer | ≤60(size≥0.3μm) | ≤100(size≥0.3μm) | NA | |||||
Scratches | ea/mm | <5,Totallength≤1/2*Diameter | <5,Totallength≤Diameter | NA | |||||
Edge chips/indents/cracks/stains/contamination | -- | None | |||||||
Polytype area | -- | None | |||||||
Front laser marking | -- | None | |||||||
Back Quality | |||||||||
Back finish | -- | C-face polished | |||||||
Scratches | ea/mm | ≤5,Total Length≤Diameter | |||||||
Back defects (edge chips/indents) | -- | None | NA | ||||||
Back roughness | nm | Ra≤5nm | |||||||
Back laser marking | -- | Notch | |||||||
Edge | |||||||||
Edge | -- | Chamfer | |||||||
Packaging | |||||||||
Packaging | -- | Epi-ready with vacuum packaging | |||||||
Packaging | -- | Multi-wafer or single wafer cassette packaging |
As an outstanding supplier of silicon carbide substrates, JXT TECHNOLOGY is committed to providing high-quality SiC materials.With advanced manufacturing processes and stringent quality control standards, we ensure our products exhibit excellent flatness and surface smoothness. As a supplier of silicon carbide materials, we focus on meeting customer demands and providing crucial support to the high-power electronic device manufacturing industry.
In industries such as precision manufacturing, optics, semiconductors, and aerospace, surface roughness is a c...
With the rapid advancement of optoelectronics and semiconductor technologies, sapphire (Al₂O₃) has gained wide...
Diamond, renowned for its exceptional hardness, thermal conductivity, and chemical stability, has gained incre...