Item | Gallium Arsenide Substrate(2~6inch ) | |||
Diameter | 50.8±0.3mm | 76.2±0.3mm | 100.0±0.3mm | 150.0±0.5mm |
Thickness | 350±25μm | 350±25μm | 350±25μm | 675±25μm |
Surface Orientation | (100) 15.0˚± 1.0˚ off toward (111) | <100>±1.0° | ||
Primary Flat Orientation | EJ<0-1-1>±1.0° | |||
Primary Flat Length | 12.0±1.5mm | 22.0±2.0mm | 32.0±2.0mm | Notch |
Secondary Flat Orientation | EJ<0-1 1>±1.0° | N/A | ||
Secondary Flat Length | 7.0±1.5mm | 12.0±2.0mm | 18.0±2.0mm | N/A |
Front Surface Finish | Epi-polished | |||
Back Surface Finish | SSP:Etched; DSP:Epi-polished | |||
Laser Mark | Back side | |||
TTV | ≤10μm | ≤10μm | ≤15μm | ≤20μm |
BOW | ≤12μm | ≤15μm | ≤20μm | ≤25μm |
WARP | ≤15μm | ≤20μm | ≤25μm | ≤30μm |
Edge Exclusion | ≤3mm | |||
Application | Conductivity for LED | Conductivity for LD | Semi-insulating for microelectronics | |
Conduction Type | N-Type | N-Type | Insulating | |
Dopant | Si-doping | Si-doping | Undoped | |
Resistivity | (1~9)E-3Ω·cm | (1~9)E-3Ω·cm | >1E7Ω·cm | |
Etch Pit Density(EPD) | <5000/cm2 | <500/cm2 | <5000/cm2 | |
Carrier Concentration | (0.4~4)E18/cm3 | (0.4~2.5)E18/cm3 | N/A | |
Mobility | >1000cm2/v.s | 1500~3000cm2/v.s | >4000cm2/v.s |
Customization specifications:
* Various sizes and shapes such as 10*10mm.
* Various types:like P-Type(Zn-doped)
* Various orientations such as(111),(110),Off-Axis:2°/6°/10°.
* Various surface roughness such as slicing,lapping.
* GaAs crystal ingots are available.
Gallium arsenide(GaAs) is an inorganic compound,which is a zinc blende crystal structure, and a black-gray solid with a melting point of1238°C. It is stably below 600°C and is not corroded by non-oxidizing acids. Compared with single crystal silicon(Si), it belongs to the second generation of semiconductor materials and also is a III-V direct band gap semiconductor.
Gallium arsenide(GaAs) has a direct band gap, higher electron mobility, high-frequency low-noise, and high conversion efficiency and other advantages in comparison to silicon(Si).
Crystal Structure | Cubic |
Lattice Constant(nm) | a=5.6534 Å |
Density(g/cm3) | 5.316 |
Melting point(℃) | 1238 |
Mohs Hardness(mohs) | 5.6 |
Dielectric Constant | 13.1 |
Band Gap(eV) | 1.424 |
Breakdown Electrical Field (MV/cm) | 3.3 |
Thermal Conductivity(W/cm.K) | 0.55 |
Thermal Expansion | 5.8*10-6/k |
Refractive Index | 3.24-3.33 |